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34k Abbreviations for chemists (brows the MOBILE EDITION) .
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Analyses
TCS
total current spectroscopy

RR
resonance Raman spectroscopy

cold spray ionization mass spectrometry

SMM
scanning microwave microscopy

SMM
scanning maxwell stress microscopy

-----

X-ray powder diffraction

X-ray single-crystal diffraction

solid-state nuclear magnetic resonance spectroscopy

EDA
exploratory data analysis

EDA
essential dynamics analysis

-----

EDA
energy decomposition analysis

selected area electron diffraction

powder X-ray diffraction

time-resolved luminescence microscopy

Fourier-transform infrared spectroscopy

-----

RBS
Rutherford backscattering spectroscopy

transient grating photoluminescence spectroscopy

time-resolved photoemission spectroscopy

TDS
thermal desorption spectroscopy

TDS
temperature derivative spectroscopy

-----

multimode infrared imaging and microspectroscopy

grazing incidence X-ray scattering

BF
bright-field

hard X-ray photoelectron spectroscopy

convergent beam electron diffraction

-----

PI
Penning ionization electron spectroscopy

DTA
differential thermal analysis

DS
dielectric spectroscopy

IC
ion chromatography

PCA
principal component analysis

-----

VCD
vibrational circular dichroism

electron energy loss spectroscopy

high-resolution electron energy loss spectroscopy

SCV
stair-case voltammetry

LSV
linear sweep voltammetry

-----

DPV
differential pulse voltammetry

PES
photnelectron spectroscopy

vibrational sum frequency spectroscopy

ambient pressure X-ray photoelectron spectroscopy

CAT
computerized axial tomography

-----

EDP
electron diffraction pattern

ESM
electrochemical strain microscopy

SEC
size exclusion chromatography

EIS
electrochemical impedance spectroscopy

IET
inelastic electron tunneling

-----

pulse-gradient spin-echo

AAS
atomic absorption spectroscopy

electron probe microanalyzer

BAM
Brewster angle microscopy

environmental X-ray diffraction

-----

low-energy ion scattering

INS
ion neutralization spectroscopy

INS
inelastic neutron scattering

high-energy X-ray scattering

XR
X-ray reflectivity

-----

particle-induced X-ray emission

surface-enhanced infrared absorption spectroscopy

derivative normal pulse voltammetry

differential normal pulse voltammetry

NR
neutron reflectometry

-----

CE
capillary electrophoresis

diffuse reflectance infrared Fourier transform spectroscopy

GC
gas chromatography

ES
electron spectroscopy

angle-dispersive X-ray diffraction

-----

reflection interference contrast microscopy

MW
microwave spectroscopy

ED
electron diffraction

EI
electron impact ionization

femtosecond stimulated Raman spectroscopy

-----

resonant mirror enhanced Raman spectroscopy

grazing incidence wide-angle X-ray scattering

XRR
X-ray reflectivity

superconducting nanowire single photon detector

angle-resolved photoemission spectroscopy

-----

coherent anti-Stokes Raman spectroscopy

EDS
energy-dispersive X-ray spectroscopy

surface-assisted laser desorption/ionization mass spectrometry

OES
optical emission spectroscopy

high temperature powder X-ray diffraction

-----

thermal gravimetry-differential thermal analysis

fast scan cyclic voltammetry

CPA
constant potential amperometry

EDX
energy-dispersive X-ray spectroscopy

energy dispersive X-ray analysis

-----

AES
auger electron spectroscopy

XRF
X-ray fluorescence

extended X-ray absorption fine structure

fluorescence lifetime imaging microscopy

TCD
thermal conductivity detection

-----

GLC
gas-liquid chromatography

VPC
vapor-phase chromatography

X-ray energy-dispersive spectroscopy

time-resolved photoluminescence spectrum

MLR
multiple linear regression

-----

laser scanning confocal microscopy

dd
double doublet

hydrogen-deuterium exchange mass spectrometry

FP
fluorescence polarization

time-resolved Kelvin probe force microscopy

-----

normal incidence reflectance spectroelectrochemistry

time-resolved fluorescence spectra

single-photon hotoionization mass spectrometry

negative ion photoelectron spectroscopy

SSM
Scanning SQUID Microscope

-----

high-performance capillary electrophoresis

BDS
broadband dielectric spectroscopy

threshold photoelectron spectrum

adsorption equilibrium infrared spectroscopy

temperature-programmed adsorption equilibrium

-----

two-dimensional electronic spectroscopy

field emission scanning electron microscopy

micellar eletrokinetic capillary chromatography

fluorous high performance liquid chromatography

reverse-phased high-performance liquid chromatography

-----

ultra high-performance liquid chromatography

micellar electrokinetic chromatography

FID
flame ionization detection

PDS
photothermal deflection spectroscopy

exciton coupled circular dichroism

-----

X-ray natural linear dichroism

inductively coupled plasma optical emission spectroscopy

energy dispersive X-ray diffraction

energy dispersive X-ray fluorescence

angle-resolved X-ray photoelectron spectroscopy

-----

synchrotron radiation-induced X-ray emission

wide-angle X-ray diffraction

femtosecond-resolved fluorescence spectrum

DRC
differential reaction calorimeter

depth-resolved cathodoluminescence spectroscopy

-----

diffuse reflectance circular dichroism

Cambridge Crystallographic Data Centre

time-of-flight secondary ion mass spectrometry

Fourier transform mass spectrometry

selected ion flow tube mass spectrometry

-----

photoionization mass spectrometry

synchrotron vacuum ultraviolet photoionization mass spectrometry

nOe
nuclear Overhauser effect

nuclear Overhauser effect spectroscopy

rotating frame nuclear Overhauser effect spectroscopy

-----

heteronuclear Overhauser effect spectroscopy

REM
reflection electron microscopy

trapping-mode atomic force microscopy

scanning kelvin probe force microscopy

CEC
capillary electrochromatography

-----

scanning surface confocal microscopy

IMS
ion-mobility spectroscopy

HAS
helium atom scattering

magnetic property measurement system

hygroscopic tandem differential mobility analysis

-----

electrochemical tunneling microscope

high-resolution fluorescence-detected X-ray absorption spectroscopy

valence-to-core X-ray emission spectroscopy

through-focus scanning optical microscopy

scanning electrochemical microscopy

-----

size-exclusion chromatography combined with multiangle laser light scattering

low energy electron diffraction

RfS
reflection spectroscopy

chiral ligand exchange capillary electrophoresis

HIC
hydrophobic interaction chromatography

-----

force-induced remnant magnetization spectroscopy

Near-field Optical Scanning Microscopy in Reflection

noise-immune cavity-enhanced optical heterodyne molecular spectroscopy

optical heterodyne molecular spectroscopy

transverse relaxation optimized spectroscopy

-----

IS
ion spectroscopy

IS
impedance spectroscopy

PIM
polymers of intrinsic microporosity

selective plane illumination microscopy

laser desorption postionization mass spectrometry

-----

high-resolution powder diffraction

high-resolution photoemission spectroscopy

time resolved luminescence spectroscopy

low energy electron microscopy

inductively coupled plasma time-of-flight mass spectrometry

-----

synchrotron radiation X-ray fluorescence

EFM
electrostatic force microscopy

time-resolved electrostatic force microscopy

SSV
substitutional stripping voltammetry

ASV
anodic stripping voltammetry

-----

ETS
electron transmission spectroscopy

RPV
rectangular pulse voltammetry

solvent gradient interaction chromatography

environmental scanning electron microscopy

photofragmentation mass spectrometry

-----

ion mobility mass spectrometer

ion mobility-mass spectrometry

natural energy decomposition analysis

PAS
polarized absorption spectroscopy

scanning ion-conductance microscope

-----

VNA
vector network analyzer

STS
scanning tunneling spectroscopy

photoconductivity detected magnetic resonance

PCS
photon correlation spectroscopy

GED
gas electron diffraction

-----

surface plasmon field-enhanced fluorescence spectroscopy

total internal reflection microscopy

Fourier transform infrared microspectroscopy

laser-induced optoacoustic spectroscopy

conducting probe atomic force microscopy

-----

cyclic staircase voltammetry

high-performance liquid chromatography

high-pressure liquid chromatography

ITC
isothermal titration calorimetry

electrospray ionization-mass spectrometry

-----

FM
fluorescence microscopy

TPM
two-photon fluorescence microscopy

EPR
electron paramagnetic resonance

ESR
electron paramagnetic resonance

ESR
electron spin resonance

-----

EA
elemental analysis

X-ray absorption near edge structure

XPS
x-ray photoelectron spectroscopy

XR
X-ray diffraction

single-crystal X-ray diffraction

-----

QMS
quadrupole mass spectrometer

quadrupole mass spectrometry

gas chromatography-mass spectrometry

PAS
photoacoustic spectroscopy

near-infrared spectroscopy

-----

SEM
scanning electron microscopy

high-resolution scanning electron microscopy

CCC
countercurrent chromatography

grazing incidence small-angle X-ray scattering

high temperature X-ray diffraction

-----

EMS
electron momentum spectroscopy

scanning photocurrent microscopy

resonant inelastic X-ray scattering

DRS
diffuse reflectance spectrum

DRS
dielectric relaxation spectroscopy

-----

steady-state isotopic transient kinetic analysis

intensity-modulated photocurrent spectroscopy

secondary ion mass spectroscopy

IFM
interference microscopy

fluorescence confocal polarizing microscopy

-----

nuclear resonance vibrational spectroscopy

RLS
resonance light scattering

laser-induced breakdown spectroscopy

ultrafast liquid chromatography

FCS
fluorescence correlation spectroscopy

-----

anomalous small-angle X-ray scattering

SWV
square wave voltammogram

time resolved laser-induced fluorescence spectroscopy

conductive atomic force microscopy

CLM
confocal luminescent microscopy

-----

angle-resolved polarized Raman spectroscopy

fiber-optic laser-induced breakdown spectroscopy

multi-angle laser light scattering

ultrasmall-angle neutron scattering

HIM
helium ion microscopy

-----

thermal-ionization mass spectroscopy

scanning electrochemical cell microscopy

UEM
ultrafast electron microscopy

MSI
mass spectrometric imaging

axisymmetric drop shape analysis

-----

AMS
accelerator mass spectrometer

HRS
hyper-Rayleigh scattering

femtosecond transient absorption

FAB
fast atom bombardment

prompt gamma activation analysis

-----

IGC
inverse gas chromatography

scanning near-field optical microscope

PND
powder neutron diffraction

differential electrochemical mass spectroscopy

SCD
single crystal diffraction

-----

AES
atomic emission spectroscopy

aerosol time-of-flight mass spectrometer

FD
field desorption (in mass spectrometry)

time-resolved mechanical spectroscopy

SIM
selected ion monitoring

-----

surface X-ray diffraction

immobilized metal affinity chromatography

electron probe microanalysis

RSS
resonant Raman scattering

resonant X-ray emission spectroscopy

-----

FFM
friction force microscopy

scanning transmission electron microscopy

scanning transmission electron microscope

proton-enhanced nuclear induction spectroscopy

single molecule fluorescence microscopy

-----

FIM
field ion microscope

CFM
chemical force microscopy

CFM
confocal fluorescence microscopy

grazing-incidence X-ray diffraction

photon scanning tunneling microscopy

-----

high resolution transmission electron microscopy

SFM
scanning force microscopy

STM
scanning tunneling microscopy

medium pressure liquid chromatography

inelastic incoherent neutron scattering

-----

EPM
electron probe microanalysis

matrix-assisted laser desorption ionization

surface enhanced resonance Raman spectroscopy

high-resolution mass spectrum

MRA
magnetic resonance angiography

-----

TGA
thermogravimetric analysis

DSC
differential scanning calorimetry

polarized light optical microscopy

heteronuclear single quantum correlation

MFM
magnetic force microscope

-----

NMR
nuclear magnetic resonance

MRS
magnetic resonance spectroscopy

GPC
gel permeation chromatography

MS2
tandem mass spectrometry

total internal reflection fluorescence microscopy

-----

DSR
dielectric relaxation spectroscopy

high-resonance electron microscopy

X-ray Spectrometry

single-molecule surface-enhanced Raman scattering

electrothermal vaporization-inductively coupled plasma at. emission spectrometry

-----

IEC
ion exchange chromatography

inductively coupled plasma atomic emission spectrometer

ISS
ion scattering spectroscopy

FMT
fluorescence microthermography

environmental transmission electron microscopy

-----

total internal reflection fluorescence microscope

small-angle X-ray diffraction

secondary ion mass spectrometry

ORD
optical rotatory dispersion

membrane introduction mass spectrometry

-----

DFS
dynamic force spectroscopy

cross relaxation appropriate for minimolecules emulated by locked spins

high-frequency electron spin resonance

DAS
decay associated spectrum

time-resolved electron spin resonance

-----

SDM
scanning displacement current microscopy

cross polarization/magic angle spinning

Nujol (a brand of mineral oil by Plough Inc.)

identical location transmission electron microscopy

multilinear regression analysis

-----

sum frequency generation imaging microscopy

energy-filtered transmission electron microscopy

UFM
ultrasonic force microscopy

ion mobility spectrometry coupled with mass spectrometry

gas-liquid partition chromatography

-----

chemical ionization mass spectroscopy

matrix-assisted laser desorption ionization time-of-flight

matrix-assisted laser desorptiiion/ionization time-of-flight mass spectroscopy

time-resolved terahertz spectroscopy

time-of-flight ion scattering spectroscopy

-----

incredible natural-abundance double-quantum transfer experiment

gas chromatography-electron impact mass spectrometry

image cross-correlation spectroscopy

differential fast scanning calorimetry

laser desorption ionization mass spectrum

-----

temperature-modulated differential scanning calorimetry

echo-planar spectroscopic imaging

time-resolved wide-angle X-ray scattering

time resolved laser fluorescence spectroscopy

photoionization time-of-flight mass spectrometry

-----

time-resolved dynamic light scattering

MDS
metastable deexcitation spectroscopy

metastable impact electron spectroscopy

speciated isotope dilution mass spectrometry

water eliminated Fourier transform

-----

spectrally-resolved fluorescence lifetime imaging microscopy

raster scan image correlation spectroscopy

scanning herium ion microscope

high resolution electrospray ionization mass spectrometry

RRS
resonance raman spectroscopy

-----

scanning kelvin probe microscopy

fourier transform ion cyclotron resonance mass spectrometer

aerosol time of flight mass spectrometry

chemical ionization mass spectrometer

scanning capacitance microscopy

-----

scanning near-field ellipsometric microscopy

heteronuclear multiple-quantum coherence

heteronuclear multiple bond correlation

WDS
wavelength dispersive spectroscopy

multiple-angle incidence resolution spectroscopy

-----

inverse photoemission spectroscopy

reversed-phase liquid chromatography

liquid chromatography-mass spectrometry

fast-phase liquid chromatography

pair interaction energy decomposition analysis

-----

matrix isolation Fourier transform infrared spectroscopy

femtosecond-infrared spectroscopy

electrochemically modulated infrared reflectance spectroscopy

RMN
Résonance magnétique nucléaire

sputter-initiated resonance ionization spectroscopy

-----

vacuum-ultraviolet circular dichroism

DMS
differential ion mobility spectrometry

UV–vis diffuse reflectance spectroscopy

X-ray free electron laser

microscope–energy-dispersive X-ray spectroscopy

-----

distortionless enhancement by polarization transfer

joint electron diffraction and vibrational spectroscopic analysis

gas chromatography-atomic emission detection

multispectral optoacoustic tomography

LTA
local thermal analysis

-----

high-angle annular dark field-scanning transmission electron microscopy

electron probe X-ray microanalysis

angle-dispersive X-ray diffraction

OCA
off-site consequence analysis

scanning magnetoresistance microscopy

-----

angular distribution Auger microscopy

collision-induced dissociation mass spectrometry

WDX
wavelength dispersive X-ray spectroscopy

Scanning Spread Resistance Microscope

PFM
piezoresponse force microscopy

-----

scanning polarization force microscopy

Kelvin probe force microscope

low-energy ion scattering spectroscopy

reflection high energy electron diffraction

total internal reflection fluorescence microscopy

-----

resonant photoemission spectroscopy

resonantly enhanced multiphoton ionization spectroscopy

elemental analysis

freeze fracture transemission electron microscopy

aberration-corrected transmission electron microscopy

-----

core-level photoemission spectroscopy

high-resolution X-ray photoemission spectroscopy

Scanning Shearing Stress Microscope

EBD
electron backscatter diffraction

GID
grazing incidence X-ray diffraction

-----

ultra-small-angle X-ray scattering

angle-resolvedultraviolet photoelectron spectroscopy

penning ionization electron spectroscopy

insensitive nuclei enhanced by polarization transfer

grazing-incidence X-ray absorption near-edge spectroscopy

-----

contact resonance atomic force microscopy

laser atomization resonance ionization spectroscopy

grazing incidence small-angle neutron scattering

TXM
transmission X-ray microscope

electron spectroscopy for chemical analysis

-----

near-field scanning optical microscopy

Nano Beam Electron Diffraction

MQS
metastable quenching spectroscopy

fluorescence-surface-enhanced Raman scattering

tandem mass spectrometry

-----

Lorentz transmission electron microscopy

surface-enhanced coherent anti-Stokes Raman spectroscopy

ultra-high-performance liquid chromatography

homonuclear Hartman-Hahn spectroscopy

two color depolarized light scattering

-----

IMS
imaging mass spectrometry

size exclusion chromatography with light scattering

TVS
transition voltage spectroscopy

rotational-echo-double-resonance

small-angle X-ray diffraction

-----

wide-angle X-ray diffraction

angle dependent X-ray photoelectron spectroscopy

resonant soft X-ray scattering

resonance surface X-ray scattering

IXS
inelastic X-ray scattering

-----

focused-ion-beam–scanning electron microscopy

exclusive correlation spectroscopy

scanning X-ray photoelectron spectromicroscopy

correlation spectroscopy

total correlation spectroscopy

-----

wide-range X-ray scanning

VCS
vibrational coherence spectroscopy

XAS
X-ray absorption spectroscopy

scanning Auger electron spectroscopy

metastable atom electron spectroscopy

-----

ultrahigh vacuum scanning tunneling microscopy

broadband cavity-enhanced absorption spectroscopy

polarization-resolved plasmon coupling microscopy

variable angle polarized absorption spectroscopy

scanning chemical potential microscope

-----

ion cyclotron resonance mass spectrometry

broadband dielectric relaxation spectroscopy

TLC
thin-layer chromatography

ambient pressure high temperature scanning tunneling microscopy

spatially offset Raman spectroscopy

-----

low-frequency Raman scattering

RIETAN-FP

RIETAN

multiple population-period transient spectroscopy

electrospray ionization-high-resolution mass spectrometry

-----

KFM
Kelvin probe force microscopy

charge modulated electro-absorption spectroscopy

confocal laser scanning fluorescence microscopy

low angle laser light scattering

tunable diode laser absorption spectroscopy

-----

binding-activated localization microscopy

m/z
mass to charge ratio (in mass spectrometry)

RPC
reversed-phase chromatography

fluorescence-enabled electrochemical microscopy

scanning thermal microscope

-----

microphotoluminescence spectroscopy

slow photoelectron spectrum

fluorescence line narrowing spectroscopy

proton-transfer-reaction mass spectrometry

X-ray photon correlation spectroscopy

-----

GEC
gel-exclusion chromatography

electrochemical nuclear magnetic resonance

low resolution mass spectrometry

inelastic electron tunneling spectroscopy

small angle neutron scattering

-----

impulsive stimulated Raman spectroscopy

XRD
X-ray diffraction

AFM
atomic force microscopy

X-ray magnetic circular dichroism

TEM
transmission electron microscopy

-----

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